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Proceedings Paper

Image formation simulation for computer-aided inspection planning of machine vision systems
Author(s): Stephan Irgenfried; Stephan Bergmann; Mahsa Mohammadikaji; Jürgen Beyerer; Carsten Dachsbacher; Heinz Wörn
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Paper Abstract

In this work, a simulation toolset for Computer Aided Inspection Planning (CAIP) of systems for automated optical inspection (AOI) is presented along with a versatile two-robot-setup for verification of simulation and system planning results. The toolset helps to narrow down the large design space of optical inspection systems in interaction with a system expert. The image formation taking place in optical inspection systems is simulated using GPU-based real time graphics and high quality off-line-rendering. The simulation pipeline allows a stepwise optimization of the system, from fast evaluation of surface patch visibility based on real time graphics up to evaluation of image processing results based on off-line global illumination calculation. A focus of this work is on the dependency of simulation quality on measuring, modeling and parameterizing the optical surface properties of the object to be inspected. The applicability to real world problems is demonstrated by taking the example of planning a 3D laser scanner application. Qualitative and quantitative comparison results of synthetic and real images are presented.

Paper Details

Date Published: 26 June 2017
PDF: 13 pages
Proc. SPIE 10334, Automated Visual Inspection and Machine Vision II, 1033406 (26 June 2017); doi: 10.1117/12.2269166
Show Author Affiliations
Stephan Irgenfried, Karlsruher Institut für Technologie (Germany)
Stephan Bergmann, Karlsruher Institut für Technologie (Germany)
Mahsa Mohammadikaji, Karlsruher Institut für Technologie (Germany)
Jürgen Beyerer, Karlsruher Institut für Technologie (Germany)
Fraunhofer-Institut für Optronik, Systemtechnik und Bildauswertung (Germany)
Carsten Dachsbacher, Karlsruher Institut für Technologie (Germany)
Heinz Wörn, Karlsruher Institut für Technologie (Germany)

Published in SPIE Proceedings Vol. 10334:
Automated Visual Inspection and Machine Vision II
Jürgen Beyerer; Fernando Puente León, Editor(s)

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