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Proceedings Paper

Predicting the yield of photonic integrated circuits using statistical compact modeling
Author(s): James Pond; Jackson Klein; Jonas Flückiger; Xu Wang; Zeqin Lu; Jaspreet Jhoja; Lukas Chrostowski
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Paper Abstract

Recent design flows for photonic integrated circuits have been able to take advantage of mature capabilities available in electronic design automation such as schematic driven design and sophisticated circuit verification. Furthermore, new photonic integrated circuit simulators that can interface with electrical circuit simulators have been developed. As a result, photonic design flows are rapidly advancing in maturity. An area that still requires development is the statistical analysis of photonic circuits to be able to predict and improve yield, which is particularly challenging because photonic components tend to be large compared to the wavelength which makes them highly sensitive to phase errors. Furthermore, photonic devices tend to have long range spatial correlations in their parameters that cannot be ignored. In this paper, we present two approaches that enable Monte Carlo analysis of photonic integrated circuits, which include the treatment of spatial correlations, and we show how they can be used to predict the circuit yield. Example circuits include passive filters made from cascaded Mach-Zehnder interferometers and transceivers using active ring modulators.

Paper Details

Date Published: 17 May 2017
PDF: 13 pages
Proc. SPIE 10242, Integrated Optics: Physics and Simulations III, 102420S (17 May 2017); doi: 10.1117/12.2268845
Show Author Affiliations
James Pond, Lumerical Solutions, Inc. (Canada)
Jackson Klein, Lumerical Solutions, Inc. (Canada)
Jonas Flückiger, Lumerical Solutions, Inc. (Canada)
Xu Wang, Lumerical Solutions, Inc. (Canada)
Zeqin Lu, The Univ. of British Columbia (Canada)
Jaspreet Jhoja, The Univ. of British Columbia (Canada)
Lukas Chrostowski, The Univ. of British Columbia (Canada)

Published in SPIE Proceedings Vol. 10242:
Integrated Optics: Physics and Simulations III
Pavel Cheben; Jiří Čtyroký; Iñigo Molina-Fernández, Editor(s)

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