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Proceedings Paper

All-optically tunable EIT-like dielectric metasurfaces hybridized with thin phase change material layers
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Paper Abstract

Electromagnetically induced transparency (EIT), a pump-induced narrow transparency window within the absorption region of a probe, had offered new perspectives in slow-light control in atomic physics. For applications in nanophotonics, the implementation on chip-scaled devices has later been obtained by mimicking this effect by metallic metamaterials. High losses in visible and near infrared range of metal-based metamaterialls have recently opened a new field of all-dielectric metamaterials; a proper configuration of high refractive index dielectric nanoresonators can mimick this effect without losses to get high Q, slow-light response. The next step would be the ability to tune their optical response, and in this work we investigate thin layers of phase change materials (PCM) for all-optical control of EIT-like all-dielectric metamaterials. PCM can be nonvolatively and reversibly switched between two stable phases that differ in optical properties by applying a visible laser pulse. The device is based on Si nanoresonators covered by a thin layer of PCM GeTe; optical and transient thermal simulations have been done to find and optimize the fabrication parameters and switching parameters such as the intensity and duration of the pulse. We have found that the EIT-like response can be switched on and off by applying the 532nm laser pulse to change the phase of the upper GeTe layer. We strongly believe that such approach could open new perspectives in all-optically controlled slow-light metamaterials.

Paper Details

Date Published: 30 May 2017
PDF: 6 pages
Proc. SPIE 10228, Nonlinear Optics and Applications X, 102280K (30 May 2017); doi: 10.1117/12.2267640
Show Author Affiliations
Emilija Petronijevic, Sapienza Univ. di Roma (Italy)
Concita Sibilia, Sapienza Univ. di Roma (Italy)

Published in SPIE Proceedings Vol. 10228:
Nonlinear Optics and Applications X
Mario Bertolotti; Joseph W. Haus; Alexei M. Zheltikov, Editor(s)

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