Proceedings Paper
Locally pressed plastic optical fibers for refractive index sensing| Format | Member Price | Non-Member Price |
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Paper Abstract
Power-based refractive index (RI) sensing is demonstrated by exploiting an ultrasonically pressed plastic optical fiber (POF). We can be easily and cost-efficiently fabricate this structure, within a short while ( ~1 s), without using external heat sources or chemical materials. We have only to simply press the horn connected to an ultrasonic transducer against part of the POF. The RI dependence of the transmitted power exhibits linear trends in the RI ranges from ~1.32 to ~1.36 (coefficient: −62 dB/RIU (RI unit)) and ~1.40 to ~1.44 (coefficient: −257 dB/RIU)). We also study the temperature dependence of the transmitted power.
Paper Details
Date Published: 23 April 2017
PDF: 4 pages
Proc. SPIE 10323, 25th International Conference on Optical Fiber Sensors, 1032358 (23 April 2017); doi: 10.1117/12.2267461
Published in SPIE Proceedings Vol. 10323:
25th International Conference on Optical Fiber Sensors
Youngjoo Chung; Wei Jin; Byoungho Lee; John Canning; Kentaro Nakamura; Libo Yuan, Editor(s)
PDF: 4 pages
Proc. SPIE 10323, 25th International Conference on Optical Fiber Sensors, 1032358 (23 April 2017); doi: 10.1117/12.2267461
Show Author Affiliations
Shumpei Shimada, Tokyo Institute of Technology (Japan)
Heeyoung Lee, Tokyo Institute of Technology (Japan)
Makoto Shizuka, Tokyo Institute of Technology (Japan)
Hiroki Tanaka, Tokyo Institute of Technology (Japan)
Heeyoung Lee, Tokyo Institute of Technology (Japan)
Makoto Shizuka, Tokyo Institute of Technology (Japan)
Hiroki Tanaka, Tokyo Institute of Technology (Japan)
Neisei Hayashi, The Univ. of Tokyo (Japan)
Yosuke Mizuno, Tokyo Institute of Technology (Japan)
Kentaro Nakamura, Tokyo Institute of Technology (Japan)
Yosuke Mizuno, Tokyo Institute of Technology (Japan)
Kentaro Nakamura, Tokyo Institute of Technology (Japan)
Published in SPIE Proceedings Vol. 10323:
25th International Conference on Optical Fiber Sensors
Youngjoo Chung; Wei Jin; Byoungho Lee; John Canning; Kentaro Nakamura; Libo Yuan, Editor(s)
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