Proceedings Paper
Multi-point strain and displacement sensor based on intensity-modulated light and two-photon absorption process in Si-avalanche photodiode| Format | Member Price | Non-Member Price |
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Paper Abstract
We propose a system for precise measurement of multi-point displacement and strain using fiber Bragg grating (FBG) sensors along with intensity-modulated light and two-photon absorption process in a Si-avalanche photodiode (Si-APD). This method sweeps both the optical wavelength and the phase difference between the two modulation signals. The FBGs’ reflection spectra and their change due to strain are successfully observed at the same time with the precision measurement of the FBG’s displacement, where the relative measurement uncertainty is 10-4. This fiber sensing system is especially suitable for structural health monitoring.
Paper Details
Date Published: 23 April 2017
PDF: 4 pages
Proc. SPIE 10323, 25th International Conference on Optical Fiber Sensors, 103238W (23 April 2017); doi: 10.1117/12.2267460
Published in SPIE Proceedings Vol. 10323:
25th International Conference on Optical Fiber Sensors
Youngjoo Chung; Wei Jin; Byoungho Lee; John Canning; Kentaro Nakamura; Libo Yuan, Editor(s)
PDF: 4 pages
Proc. SPIE 10323, 25th International Conference on Optical Fiber Sensors, 103238W (23 April 2017); doi: 10.1117/12.2267460
Show Author Affiliations
Hiromasa Miyazawa, Tokyo Univ. of Agriculture and Technology (Japan)
Masaya Nemoto, Tokyo Univ. of Agriculture and Technology (Japan)
Yoshiki Yamada, Tokyo Univ. of Agriculture and Technology (Japan)
Masaya Nemoto, Tokyo Univ. of Agriculture and Technology (Japan)
Yoshiki Yamada, Tokyo Univ. of Agriculture and Technology (Japan)
Yosuke Tanaka, Tokyo Univ. of Agriculture and Technology (Japan)
Takashi Kurokawa, Tokyo Univ. of Agriculture and Technology (Japan)
Takashi Kurokawa, Tokyo Univ. of Agriculture and Technology (Japan)
Published in SPIE Proceedings Vol. 10323:
25th International Conference on Optical Fiber Sensors
Youngjoo Chung; Wei Jin; Byoungho Lee; John Canning; Kentaro Nakamura; Libo Yuan, Editor(s)
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