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Proceedings Paper

Measurements of the dielectric properties of explosives and inert materials at millimeter wave frequencies (V-band and above) using free space reflection methods
Author(s): Peter R. Smith; James C. Weatherall; Jeffrey Barber; Kevin Yam; Joseph Greca; Barry T. Smith
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Paper Abstract

We present a free space material measurement system operating in the E band (60-90 GHz) frequency range that uses calibration standards placed at the sample location to define the measurement reference plane directly at the sample surface. Measurement signal to noise is improved by using an aperture in radar absorbing material (RAM) to simplify the RF measurement environment. Measurements are provided that extend earlier work done in the 18-40 GHz frequency range. Data is extracted using numerical fitting of reflection-only data to a theoretical model based on geometric optics. System calibration, and results are presented.

Paper Details

Date Published: 11 May 2017
PDF: 8 pages
Proc. SPIE 10189, Passive and Active Millimeter-Wave Imaging XX, 1018908 (11 May 2017); doi: 10.1117/12.2267195
Show Author Affiliations
Peter R. Smith, AASKI Technology, Inc. (United States)
James C. Weatherall, Battelle Memorial Institute (United States)
Jeffrey Barber, U.S. Dept. of Homeland Security (United States)
Kevin Yam, Battelle Memorial Institute (United States)
Joseph Greca, Battelle Memorial Institute (United States)
Barry T. Smith, U.S. Dept. of Homeland Security (United States)

Published in SPIE Proceedings Vol. 10189:
Passive and Active Millimeter-Wave Imaging XX
David A. Wikner; Duncan A. Robertson, Editor(s)

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