Proceedings Paper
Study of higher order correlation functions and photon statistics using multiphoton-subtracted states and quadrature measurements| Format | Member Price | Non-Member Price |
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Paper Abstract
The estimation of high order correlation function values is an important problem in the field of quantum computation. We show that the problem can be reduced to preparation and measurement of optical quantum states resulting after annihilation of a set number of quanta from the original beam. We apply this approach to explore various photon bunching regimes in optical states with gamma-compounded Poisson photon number statistics. We prepare and perform measurement of the thermal quantum state as well as states produced by subtracting one to ten photons from it. Maximum likelihood estimation is employed for parameter estimation. The goal of this research is the development of highly accurate procedures for generation and quality control of optical quantum states.
Paper Details
Date Published: 30 December 2016
PDF: 8 pages
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242Q (30 December 2016); doi: 10.1117/12.2266853
Published in SPIE Proceedings Vol. 10224:
International Conference on Micro- and Nano-Electronics 2016
Vladimir F. Lukichev; Konstantin V. Rudenko, Editor(s)
PDF: 8 pages
Proc. SPIE 10224, International Conference on Micro- and Nano-Electronics 2016, 102242Q (30 December 2016); doi: 10.1117/12.2266853
Show Author Affiliations
Yu. I. Bogdanov, Institute of Physics and Technology (Russian Federation)
National Research Nuclear Univ. “MEPhI” (Russian Federation)
National Research Univ. of Electronic Technology MIET (Russian Federation)
K. G. Katamadze, Institute of Physics and Technology (Russian Federation)
National Research Nuclear Univ. “MEPhI” (Russian Federation)
M.V. Lomonosov Moscow State Univ. (Russian Federation)
G. V. Avosopyants, Institute of Physics and Technology (Russian Federation)
National Research Univ. of Electronic Technology MIET (Russian Federation)
M.V. Lomonosov Moscow State Univ. (Russian Federation)
L. V. Belinsky, Institute of Physics and Technology (Russian Federation)
National Research Univ. of Electronic Technology MIET (Russian Federation)
National Research Nuclear Univ. “MEPhI” (Russian Federation)
National Research Univ. of Electronic Technology MIET (Russian Federation)
K. G. Katamadze, Institute of Physics and Technology (Russian Federation)
National Research Nuclear Univ. “MEPhI” (Russian Federation)
M.V. Lomonosov Moscow State Univ. (Russian Federation)
G. V. Avosopyants, Institute of Physics and Technology (Russian Federation)
National Research Univ. of Electronic Technology MIET (Russian Federation)
M.V. Lomonosov Moscow State Univ. (Russian Federation)
L. V. Belinsky, Institute of Physics and Technology (Russian Federation)
National Research Univ. of Electronic Technology MIET (Russian Federation)
N. A. Bogdanova, Institute of Physics and Technology (Russian Federation)
National Research Univ. of Electronic Technology MIET (Russian Federation)
S. P. Kulik, M.V. Lomonosov Moscow State Univ. (Russian Federation)
V. F. Lukichev, Institute of Physics and Technology (Russian Federation)
National Research Univ. of Electronic Technology MIET (Russian Federation)
S. P. Kulik, M.V. Lomonosov Moscow State Univ. (Russian Federation)
V. F. Lukichev, Institute of Physics and Technology (Russian Federation)
Published in SPIE Proceedings Vol. 10224:
International Conference on Micro- and Nano-Electronics 2016
Vladimir F. Lukichev; Konstantin V. Rudenko, Editor(s)
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