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Proceedings Paper

Towards brilliant, compact x-ray sources: a new x-ray photonic device
Author(s): Brian Scherer; Sudeep Mandal; Joshua Salisbury; Peter Edic; Forrest Hopkins; Susanne M. Lee
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Paper Abstract

General Electric has designed an innovative x-ray photonic device that concentrates a polychromatic beam of diverging x-rays into a less divergent, parallel, or focused x-ray beam. The device consists of multiple, thin film multilayer stacks. X-rays incident on a given multilayer stack propagate within a high refractive index transmission layer while undergoing multiple total internal reflections from a novel, engineered multilayer containing materials of lower refractive index. Development of this device could lead to order-of-magnitude flux density increases, over a large broadband energy range from below 20 keV to above 300 keV. In this paper, we give an overview of the device and present GE’s progress towards fabricating prototype devices.

Paper Details

Date Published: 1 May 2017
PDF: 6 pages
Proc. SPIE 10187, Anomaly Detection and Imaging with X-Rays (ADIX) II, 101870G (1 May 2017); doi: 10.1117/12.2266793
Show Author Affiliations
Brian Scherer, GE Global Research (United States)
Sudeep Mandal, GE Global Research (United States)
Joshua Salisbury, GE Global Research (United States)
Peter Edic, GE Global Research (United States)
Forrest Hopkins, GE Global Research (United States)
Susanne M. Lee, GE Global Research (United States)

Published in SPIE Proceedings Vol. 10187:
Anomaly Detection and Imaging with X-Rays (ADIX) II
Amit Ashok; Edward D. Franco; Michael E. Gehm; Mark A. Neifeld, Editor(s)

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