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Proceedings Paper

High-resolution spectral reflection measurements on selected optical-black baffle coatings in the 5-20 um region
Author(s): Christopher W. Brown; Donald R. Smith
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Paper Abstract

The high-resolution (4 cm1) spectral characteristics of radiation specularly reflected and diffusely scattered from selected optical-black coatings in the infrared from 5 to 20 microns are reported. Various one-, two- and three-coat samples were measured for numerous combinations of incident and output angles. Many spectra show a surprising number of strong, sharp features, especially in the specular direction. The results for several commercially available and widely used black coatings are compared and interpreted.

Paper Details

Date Published: 1 December 1990
PDF: 31 pages
Proc. SPIE 1331, Stray Radiation in Optical Systems, (1 December 1990); doi: 10.1117/12.22666
Show Author Affiliations
Christopher W. Brown, Univ. of Rhode Island (United States)
Donald R. Smith, U.S. Air Force Geophysics Lab. (United States)

Published in SPIE Proceedings Vol. 1331:
Stray Radiation in Optical Systems
Robert P. Breault, Editor(s)

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