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Proceedings Paper

Bidirectional reflectance distribution function of germanium at 3.39 um
Author(s): Karen J. Sorensen; Tony L. Roe
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Paper Abstract

Bidirectional reflectance distribution function (BRDF) measurements were made on single crystal, multicrystalline, and polycrystalline germanium (Ge). The multicrystalline substrate is a newly developed form of germanium that contains a few large crystals and has a structure that is more uniform than the polycrystalline material. Measurements were made with a helium neon laser operating at 3.39 microns with a 100 angle of incidence. The BRDF of the multicrystalline material more closely resembles that of the single crystal material than it does the polycrystalline material. The bulk material of the polycrystalline germanium scatters more than that of the single crystal germanium, and therefore has more effect on total sample BRDF.

Paper Details

Date Published: 1 December 1990
PDF: 6 pages
Proc. SPIE 1331, Stray Radiation in Optical Systems, (1 December 1990); doi: 10.1117/12.22664
Show Author Affiliations
Karen J. Sorensen, GenCorp Aerojet ElectroSystems Co. (United States)
Tony L. Roe, GenCorp Aerojet ElectroSystems Co. (United States)

Published in SPIE Proceedings Vol. 1331:
Stray Radiation in Optical Systems
Robert P. Breault, Editor(s)

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