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Proceedings Paper

Advances in III-V based dual-band MWIR/LWIR FPAs at HRL
Author(s): Pierre-Yves Delaunay; Brett Z. Nosho; Alexander R. Gurga; Sevag Terterian; Rajesh D. Rajavel
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Paper Abstract

Recent advances in superlattice-based infrared detectors have rendered this material system a solid alternative to HgCdTe for dual-band sensing applications. In particular, superlattices are attractive from a manufacturing perspective as the epitaxial wafers can be grown with a high degree of lateral uniformity, low macroscopic defect densities (< 50 cm-2) and achieve dark current levels comparable to HgCdTe detectors. In this paper, we will describe our recent effort on the VISTA program towards producing HD-format (1280x720, 12 μm pitch) superlattice based, dual-band MWIR/LWIR FPAs. We will report results from several multi-wafer fabrication lots of 1280x720, 12 μm pitch FPAs processed over the last two years. To assess the FPA performance, noise equivalent temperature difference (NETD) measurements were conducted at 80K, f/4.21 and using a blackbody range of 22°C to 32°C. For the MWIR band, the NETD was 27.44 mK with a 3x median NETD operability of 99.40%. For the LWIR band, the median NETD was 27.62 mK with a 3x median operability of 99.09%. Over the course of the VISTA program, HRL fabricated over 30 FPAs with similar NETDs and operabilities in excess of 99% for both bands, demonstrating the manufacturability and high uniformity of III-V superlattices. We will also present additional characterization results including blinkers, spatial stability, modulation transfer function and thermal cycles reliability.

Paper Details

Date Published: 16 May 2017
PDF: 12 pages
Proc. SPIE 10177, Infrared Technology and Applications XLIII, 101770T (16 May 2017); doi: 10.1117/12.2266278
Show Author Affiliations
Pierre-Yves Delaunay, HRL Labs., LLC (United States)
Brett Z. Nosho, HRL Labs., LLC (United States)
Alexander R. Gurga, HRL Labs., LLC (United States)
Sevag Terterian, HRL Labs., LLC (United States)
Rajesh D. Rajavel, HRL Labs., LLC (United States)

Published in SPIE Proceedings Vol. 10177:
Infrared Technology and Applications XLIII
Bjørn F. Andresen; Gabor F. Fulop; Charles M. Hanson; John Lester Miller; Paul R. Norton, Editor(s)

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