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Proceedings Paper

Study of performance loss of Lyman alpha filters due to chemical contamination
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Paper Abstract

Observations in the UV and EUV allow many diagnostics of the outer layers of the stars and the Sun so that more and more space telescopes are developed to operate in this fundamental spectral range. However, absorption by residual contaminants coming from polymers outgassing causes critical effects such as loss of signal, spectral shifts, stray light… Thus, a cleanliness and contamination control plan has to be defined to mitigate the risk of damage of sensitive surfaces. In order to specify acceptable cleanliness levels, it is paramount to improve our knowledge and understanding of contamination effects, especially in the UV/EUV range. Therefore, an experimental study has been carried out in collaboration between CNES and IAS, in the frame of the development of the Extreme UV Imager suite for the ESA Solar Orbiter mission; this instrument consists of two High Resolution Imagers and one Full Sun Imager designed for narrow pass-band EUV imaging of the solar corona, and thus very sensitive to contamination. Here, we describe recent results of performance loss measured on representative optical samples. Six narrow pass-band filters, with a multilayer coating designed to select the solar Lyman Alpha emission ray, were contaminated with different amounts of typical chemical species. The transmittance spectra were measured between 100 and 200 nm under high vacuum on the SOLEIL synchrotron beam line. They were compared before and after contamination, and also after a long exposure of the contaminated area to EUV-visible radiations.

Paper Details

Date Published: 15 May 2017
PDF: 9 pages
Proc. SPIE 10236, Damage to VUV, EUV, and X-ray Optics VI, 102360F (15 May 2017); doi: 10.1117/12.2265864
Show Author Affiliations
Delphine Faye, Ctr. National d'Études Spatiales (France)
Xueyan Zhang, Institut d'Astrophysique Spatiale, Univ. Paris Sud (France)
Pierre Etcheto, Ctr. National d'Études Spatiales (France)
Frédéric Auchère, Institut d'Astrophysique Spatiale, Univ. Paris Sud (France)

Published in SPIE Proceedings Vol. 10236:
Damage to VUV, EUV, and X-ray Optics VI
Libor Juha; Saša Bajt; Regina Soufli, Editor(s)

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