Proceedings Paper
Advanced holographic wavefront sensor| Format | Member Price | Non-Member Price |
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Paper Abstract
Optical science and technologies require fast and precise measurements of wavefront curvature. Amount of wavefront measurement methods increased in the last few years. The important part of the modern wavefront sensors are holographic optical elements (HOE). This article shows a possibility of using HOE for generating Zernike aberration modes.
Paper Details
Date Published: 15 May 2017
PDF: 6 pages
Proc. SPIE 10233, Holography: Advances and Modern Trends V, 102330Z (15 May 2017); doi: 10.1117/12.2265686
Published in SPIE Proceedings Vol. 10233:
Holography: Advances and Modern Trends V
Miroslav Hrabovský; John T. Sheridan; Antonio Fimia, Editor(s)
PDF: 6 pages
Proc. SPIE 10233, Holography: Advances and Modern Trends V, 102330Z (15 May 2017); doi: 10.1117/12.2265686
Show Author Affiliations
Alina Gorelaya, Saint Petersburg Electrotechnical Univ. "LETI" (Russian Federation)
Mikhail Kovalev, Bauman Moscow State Technical Univ. (Russian Federation)
Polina Malinina, Bauman Moscow State Technical Univ. (Russian Federation)
Sergey Odinokov, Bauman Moscow State Technical Univ. (Russian Federation)
Mikhail Kovalev, Bauman Moscow State Technical Univ. (Russian Federation)
Polina Malinina, Bauman Moscow State Technical Univ. (Russian Federation)
Sergey Odinokov, Bauman Moscow State Technical Univ. (Russian Federation)
Maksim Soloviev, Saint Petersburg Electrotechnical Univ. "LETI" (Russian Federation)
Alexander Sevryugin, Saint Petersburg Electrotechnical Univ. "LETI" (Russian Federation)
Vladimir Venediktov, Saint Petersburg Electrotechnical Univ. "LETI" (Russian Federation)
Saint Petersburg State Univ. (Russian Federation)
Alexander Sevryugin, Saint Petersburg Electrotechnical Univ. "LETI" (Russian Federation)
Vladimir Venediktov, Saint Petersburg Electrotechnical Univ. "LETI" (Russian Federation)
Saint Petersburg State Univ. (Russian Federation)
Published in SPIE Proceedings Vol. 10233:
Holography: Advances and Modern Trends V
Miroslav Hrabovský; John T. Sheridan; Antonio Fimia, Editor(s)
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