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Proceedings Paper

Determination of refractive index of submicron-thick films using resonance shift in a four-layer slab waveguide
Author(s): Edgars Nitiss; Andrejs Tokmakov
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Paper Abstract

The measurement of refractive index of very thin films at the order of ten to hundred nanometers is cumbersome and usually requires employing sophisticated techniques such as the spectral ellipsometry. In this paper we describe a simple contact method for measuring the refractive index of thin films. Here we have used the prism-coupling technique for characterizing samples prepared as four-layer slab waveguides. The waveguide resonance condition can be calculated by solving simple analytic transcendental equations for the slab waveguide. Then the captured mode position as a function of cladding thickness is used for probing the refractive index of cladding layer. We used indium-tin-oxide layer on glass as the substrate and polysulfone with known refractive index as the material for testing the method. In the paper we provide the theoretical background of the method, demonstrate the experimental results obtained during the implementation of the technique as well as discuss its main strengths and flaws.

Paper Details

Date Published: 17 May 2017
PDF: 9 pages
Proc. SPIE 10242, Integrated Optics: Physics and Simulations III, 102420X (17 May 2017); doi: 10.1117/12.2265415
Show Author Affiliations
Edgars Nitiss, Univ. of Latvia (Latvia)
Andrejs Tokmakov, Univ. of Latvia (Latvia)


Published in SPIE Proceedings Vol. 10242:
Integrated Optics: Physics and Simulations III
Pavel Cheben; Jiří Čtyroký; Iñigo Molina-Fernández, Editor(s)

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