
Proceedings Paper
Conductivity depth imaging of Airborne Electromagnetic data with double pulse transmitting current based on model fusionFormat | Member Price | Non-Member Price |
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Paper Abstract
The airborne electromagnetic (AEM) systems have been used traditionally in mineral exploration. Typically the system transmits a single pulse waveform to detect conductive anomaly. Conductivity-depth imaging (CDI) of data is generally applied in identifying conductive targets. A CDI algorithm with double-pulse transmitting current based on model fusion is developed. The double-pulse is made up of a half-sine pulse of high power and a trapezoid pulse of low power. This CDI algorithm presents more shallow information than traditional CDI with a single pulse. The electromagnetic response with double-pulse transmitting current is calculated by linear convolution based on forward modeling. The CDI results with half-sine and trapezoid pulse are obtained by look-up table method, and the two results are fused to form a double-pulse conductivity-depth imaging result. This makes it possible to obtain accurate conductivity and depth. Tests on synthetic data demonstrate that CDI algorithm with double-pulse transmitting current based on model fusion maps a wider range of conductivities and does a better job compared with CDI with a single pulse transmitting current in reflecting the whole geological conductivity changes.
Paper Details
Date Published: 23 January 2017
PDF: 7 pages
Proc. SPIE 10322, Seventh International Conference on Electronics and Information Engineering, 103221M (23 January 2017); doi: 10.1117/12.2265222
Published in SPIE Proceedings Vol. 10322:
Seventh International Conference on Electronics and Information Engineering
Xiyuan Chen, Editor(s)
PDF: 7 pages
Proc. SPIE 10322, Seventh International Conference on Electronics and Information Engineering, 103221M (23 January 2017); doi: 10.1117/12.2265222
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Published in SPIE Proceedings Vol. 10322:
Seventh International Conference on Electronics and Information Engineering
Xiyuan Chen, Editor(s)
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