Proceedings Paper
Integrated Sagnac optical gyroscope sensor using ultra-low loss high aspect ratio silicon nitride waveguide coil| Format | Member Price | Non-Member Price |
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Paper Abstract
We demonstrate operation of an interferometric optical gyroscope that uses an on-chip 3m ultra-low-loss silicon nitride waveguide coil. The measured minimum waveguide loss of the waveguide coil fabricated using lithographic die stitching was 0.78 dB/m. The angle random walk and bias instability of the gyroscope were characterized to be 8.52 deg/hr1/2 and 58.7 deg/hr respectively.
Paper Details
Date Published: 23 April 2017
PDF: 4 pages
Proc. SPIE 10323, 25th International Conference on Optical Fiber Sensors, 103231A (23 April 2017); doi: 10.1117/12.2263411
Published in SPIE Proceedings Vol. 10323:
25th International Conference on Optical Fiber Sensors
Youngjoo Chung; Wei Jin; Byoungho Lee; John Canning; Kentaro Nakamura; Libo Yuan, Editor(s)
PDF: 4 pages
Proc. SPIE 10323, 25th International Conference on Optical Fiber Sensors, 103231A (23 April 2017); doi: 10.1117/12.2263411
Show Author Affiliations
Sarat Gundavarapu, Univ. of California, Santa Barbara (United States)
Michael Belt, Univ. of California, Santa Barbara (United States)
Taran Huffman, Univ. of California, Santa Barbara (United States)
Minh A. Tran, Univ. of California, Santa Barbara (United States)
Michael Belt, Univ. of California, Santa Barbara (United States)
Taran Huffman, Univ. of California, Santa Barbara (United States)
Minh A. Tran, Univ. of California, Santa Barbara (United States)
Tin Komljenovic, Univ. of California, Santa Barbara (United States)
John E. Bowers, Univ. of California, Santa Barbara (United States)
Daniel J. Blumenthal, Univ. of California, Santa Barbara (United States)
John E. Bowers, Univ. of California, Santa Barbara (United States)
Daniel J. Blumenthal, Univ. of California, Santa Barbara (United States)
Published in SPIE Proceedings Vol. 10323:
25th International Conference on Optical Fiber Sensors
Youngjoo Chung; Wei Jin; Byoungho Lee; John Canning; Kentaro Nakamura; Libo Yuan, Editor(s)
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