Share Email Print

Proceedings Paper

Optical frequency domain reflectometry for aerospace applications
Author(s): Stephen T. Kreger; Osgar John Ohanian III; Naman Garg; Matthew A. Castellucci; Dan Kominski; Nur Aida Abdul Rahim; Matthew A. Davis; Noah B. Beaty; James W. Jeans; Emily H. Templeton; J. R. Pedrazzani
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Optical Frequency Domain Reflectometry (OFDR) is the basis of an emerging high-definition distributed fiber optic sensing (HD-FOS) technique that provides an unprecedented combination of resolution and sensitivity. We examine aerospace applications that benefit from HD-FOS, such as for defect detection, FEA model verification, and structural health monitoring. We describe how HD-FOS is used in applications spanning the full design chain, review progress with sensor response calibration and certification, and examine the challenges of data management through the use of event triggering, synchronizing data acquisition with control signals, and integrating the data output with established industry protocols and acquisition systems.

Paper Details

Date Published: 27 April 2017
PDF: 12 pages
Proc. SPIE 10208, Fiber Optic Sensors and Applications XIV, 1020803 (27 April 2017); doi: 10.1117/12.2262845
Show Author Affiliations
Stephen T. Kreger, Luna Innovations Inc. (United States)
Osgar John Ohanian III, Luna Innovations Inc. (United States)
Naman Garg, Luna Innovations Inc. (United States)
Matthew A. Castellucci, Luna Innovations Inc. (United States)
Dan Kominski, Luna Innovations Inc. (United States)
Nur Aida Abdul Rahim, Luna Innovations Inc. (United States)
Matthew A. Davis, Luna Innovations Inc. (United States)
Noah B. Beaty, Luna Innovations Inc. (United States)
James W. Jeans, Structural Design & Analysis Inc. (United States)
Emily H. Templeton, Luna Innovations Inc. (United States)
J. R. Pedrazzani, Luna Innovations Inc. (United States)

Published in SPIE Proceedings Vol. 10208:
Fiber Optic Sensors and Applications XIV
Christopher S. Baldwin; Gary Pickrell; Henry H. Du, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?