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Proceedings Paper

Contaminant mass estimation of powder contaminated surfaces
Author(s): Timothy J. Gibbs; David W. Messinger
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Paper Abstract

How can we determine the physical characteristics of a mixture of multiple materials within a single pixel? Intimate mixing occurs when different materials within the region encompassed by a pixel interact with each other prior to reaching the sensor. For powder contaminated surfaces, nonlinear mixing is unavoidable. The Nonconventional Exploitation Factors Data System (NEFDS) Contamination Model can make longwave hyperspectral mixture signatures, but only for a small subset of their spectral library. In addition, the model uses percent coverage as its only physical property input despite it not being informative to the contaminants physical properties. Through a complex parameter inversion, the NEFDS contamination model can be used to derive various physical properties. These physical characteristics were estimated by using empirically measured data of varying contaminant amounts using a Designs and Prototypes Fourier transform infrared spectrometer. Once estimated parameters are found, the mixture spectra was recreated and compared to the measured data. The estimated areal coverage density is used to derive a total deposited mass on the surface based on the area of contaminated surface. This is compared to the known amount deposited that was measured during the experimental campaign. This paper presents some results of those measurements and model estimates.

Paper Details

Date Published: 5 May 2017
PDF: 11 pages
Proc. SPIE 10198, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XXIII, 101980M (5 May 2017); doi: 10.1117/12.2262584
Show Author Affiliations
Timothy J. Gibbs, Rochester Institute of Technology (United States)
David W. Messinger, Rochester Institute of Technology (United States)

Published in SPIE Proceedings Vol. 10198:
Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XXIII
Miguel Velez-Reyes; David W. Messinger, Editor(s)

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