
Proceedings Paper
Strategies for reducing SWAP-C and complexity in DVE sensor systemsFormat | Member Price | Non-Member Price |
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Paper Abstract
The solution space to the DVE sensor problem can be considered to be a continuum where the goal is to minimize Size, Weight, Power, Cost (SWAP-C), and complexity while simultaneously maximizing performance. Performance is often achieved at the expense of SWAP-C and complexity. The core DVE sensor system technologies can be grouped into three broad areas: (1) sensors (e.g., LiDAR, radar, or imaging); (2) data processing such as fusion or sensor processing; and (3) synthetic vision, and symbology. Much of the body of DVE sensor research has focused on advancing the current state of the art in one or more of these particular areas, such as advanced sensing and/or data processing technologies. However, often the difficulties of integrating such a DVE technology into an aircraft and obtaining the proper hardware/software certification(s) for flight are not considered. Both of these adversely impact SWAP-C and complexity. In this paper we examine the solution space to the DVE sensor problem, identify the key drivers for SWAP-C and complexity, and present strategies for their mitigation.
Paper Details
Date Published: 5 May 2017
PDF: 8 pages
Proc. SPIE 10197, Degraded Environments: Sensing, Processing, and Display 2017, 101970M (5 May 2017); doi: 10.1117/12.2262569
Published in SPIE Proceedings Vol. 10197:
Degraded Environments: Sensing, Processing, and Display 2017
John (Jack) N. Sanders-Reed; Jarvis (Trey) J. Arthur III, Editor(s)
PDF: 8 pages
Proc. SPIE 10197, Degraded Environments: Sensing, Processing, and Display 2017, 101970M (5 May 2017); doi: 10.1117/12.2262569
Show Author Affiliations
Erich Schramm, The Boeing Co. (United States)
Rajib Mitra, The Boeing Co. (United States)
Rajib Mitra, The Boeing Co. (United States)
Published in SPIE Proceedings Vol. 10197:
Degraded Environments: Sensing, Processing, and Display 2017
John (Jack) N. Sanders-Reed; Jarvis (Trey) J. Arthur III, Editor(s)
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