Share Email Print

Proceedings Paper

RICOR K527 highly reliable linear cooler: applications and model overview
Author(s): Sergey Riabzev; Ilan Nachman; Eli Levin; Adam Perach; Igor Vainshtein; Dan Gover
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The K527 linear cooler was developed in order to meet the requirements of reliability, cooling power needs and versatility for a wide range of applications such as hand held, 24/7 and MWS. During the recent years the cooler was incorporated in variety of systems. Some of these systems can be sensitive to vibrations which are induced from the cooler. In order to reduce those vibrations significantly, a Tuned Dynamic Absorber (TDA) was added to the cooler. Other systems, such as the MWS type, are not sensitive to vibrations, but require a robust cooler in order to meet the high demand for environmental vibration and temperature. Therefore various mounting interfaces are designed to meet system requirements. The latest K527 version was designed to be integrated with the K508 cold finger, in order to give it versatility to standard detectors that are already designed and available for the K508 cooler type. The reliability of the cooler is of a high priority. In order to meet the 30,000 working hours target, special design features were implemented. Eight K527 coolers have passed the 19,360 working hours without degradations, and are still running according to our expectations.

Paper Details

Date Published: 5 May 2017
PDF: 17 pages
Proc. SPIE 10180, Tri-Technology Device Refrigeration (TTDR) II, 101800G (5 May 2017); doi: 10.1117/12.2262470
Show Author Affiliations
Sergey Riabzev, RICOR Cryogenic & Vacuum Systems (Israel)
Ilan Nachman, RICOR Cryogenic & Vacuum Systems (Israel)
Eli Levin, RICOR Cryogenic & Vacuum Systems (Israel)
Adam Perach, RICOR Cryogenic & Vacuum Systems (Israel)
Igor Vainshtein, RICOR Cryogenic & Vacuum Systems (Israel)
Dan Gover, RICOR Cryogenic & Vacuum Systems (Israel)

Published in SPIE Proceedings Vol. 10180:
Tri-Technology Device Refrigeration (TTDR) II
Richard I. Epstein; Bjørn F. Andresen; Tonny Benschop; Joseph P. Heremans; Sergey V. Riabzev; Mansoor Sheik-Bahae, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?