
Proceedings Paper
Holographic NDT methods for plastic pipe vibration and brittle crack propagation analysisFormat | Member Price | Non-Member Price |
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Paper Abstract
Plastic pipes are frequently used for low pressure gas and water distribution. One of the main problems with their wide commercial applications is rapid crack propagation (RCP). This results in enormous losses of energy resources and environment pollution. Recent incidents show that it is of importance to find criteria to assess the safety conditions for large diameter piping before its installation. In this report some results of holographic non-destructive testing of plastic pipes are presented. Double-pulse holographic interferometry measurements of stress distribution at small scale steady state (S4) tests for 3 - 5 bar pressurized plastic pipes with (phi) 110 mm to 200 mm were performed. Also the mechanically induced vibration modes of non-pressurized (phi) 200 mm plastic pipe were visualized with the purpose to check stress distribution.
Paper Details
Date Published: 3 November 1995
PDF: 9 pages
Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); doi: 10.1117/12.226232
Published in SPIE Proceedings Vol. 2648:
International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
Sergey V. Svechnikov; Mikhail Ya. Valakh, Editor(s)
PDF: 9 pages
Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); doi: 10.1117/12.226232
Show Author Affiliations
Vladimir B. Markov, Institute of Applied Optics (Ukraine) and Ctr. Internacional de Fisica (Colombia)
Pierre Michel Boone, Univ. Gent (Belgium)
Pierre Michel Boone, Univ. Gent (Belgium)
Philippe Vanspeybroeck, BECETEL (Belgium)
Published in SPIE Proceedings Vol. 2648:
International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
Sergey V. Svechnikov; Mikhail Ya. Valakh, Editor(s)
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