Share Email Print

Proceedings Paper

A turn-key calibration roadmap for temperature and radiance from 0.3-14um
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Many existing and emerging remote sensing applications in the UV, Visible, NIR, SWIR, MWIR and LWIR regions are challenging the conventional thinking of radiance and temperature calibration techniques. While the relationship between blackbody temperature and optical radiation is well understood, often there is an “invisible” dividing line between treatments of these values as either optical radiance or temperature. It is difficult to perform seamless temperature and radiance calibrations across the point of 2.5um. Spectrum above 2.5um is typically related in temperature terms and below 2.5um may be either spoken of in terms of temperature or optical radiance. There is also a natural unit “convergence” issue at 2.5um, due to the crossover of significant levels of emissivity, reflectance and temperature at this point. NMI traceability in the spectral region of 2.5-14.0um can also be a problem especially for spectral radiance. This paper will outline a possible turn-key test bench solution that provides traceable solutions for both temperature and radiance value in these regimes. The intent of this paper is to offer a possible solution and challenge the infrastructure that exists today over the 0.3-14um range in order to obtain a valid spectral radiance or temperature value, or both, to support emerging sensor fusion technology.

Paper Details

Date Published: 3 May 2017
PDF: 16 pages
Proc. SPIE 10178, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVIII, 1017804 (3 May 2017); doi: 10.1117/12.2262297
Show Author Affiliations
Joe Jablonski, Labsphere, Inc. (United States)
Chris Durell, Labsphere, Inc. (United States)
Joe LaVeigne, Santa Barbara Infrared, Inc. (United States)
D. Fred King, Santa Barbara Infrared, Inc. (United States)

Published in SPIE Proceedings Vol. 10178:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVIII
Gerald C. Holst; Keith A. Krapels, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?