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Proceedings Paper

Analysis of mineral composition by infrared spectral imaging using quantum dot focal plane array sensor
Author(s): Chenhui Huang; Tomo Tanaka; Sota Kagami; Yoshiki Ninomiya; Masahiro Kakuda; Katsuyuki Watanabe; Sei Inoue; Kenji Nanba; Yuichi Igarashi; Masahiro Tanomura; Tsuyoshi Yamamoto; Akinobu Shibuya; Kentaro Nakahara; Shin-ichi Yorozu; Yasuhiko Arakawa
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Paper Abstract

In this report, mineral composition of rock samples including conglomerate, sandstone, and dolomite was analyzed by IR spectral imaging using QDIP focal plane arrays (FPAs) with a peak-responsivity wavelength of 6.5 μm (FPA 1) and 5.5 μm (FPA 2). The qualitative and quantitative analyses are presented, and the key factor that determines the quantitative precision is discussed. In the qualitative analysis, the luminance of the different components in the rock samples was compared in the image. In the FPA 1 images, the shell fossil in the conglomerate sample and the limestone in the sandstone sample were darker than the other parts of the rocks due to their low emittance at 6.5 μm. In contrast, the difference in the luminance is hardly observed in the FPA 2 images under the same conditions. In the quantitative analysis, the emittance of dolomite was measured. Ten points in the IR image were randomly selected and the average emittance was calculated. The obtained emittances were 0.544±0.012 (FPA 1) and 0.941±0.019 (FPA 2), which means the coefficient of variation of the emittance measurement is ±2.1%~2.2%. By calculating the propagation of error, the precision of thermocouples for monitoring the temperature of the rocks in the calibration contributes most significantly (73%) to the total error.

Paper Details

Date Published: 16 May 2017
PDF: 8 pages
Proc. SPIE 10231, Optical Sensors 2017, 102310N (16 May 2017); doi: 10.1117/12.2262048
Show Author Affiliations
Chenhui Huang, NEC Corp. (Japan)
Tomo Tanaka, NEC Corp. (Japan)
The Univ. of Tokyo (Japan)
Sota Kagami, NEC Corp. (Japan)
The Univ. of Tokyo (Japan)
Yoshiki Ninomiya, National Institute of Advanced Industrial Science and Technology (Japan)
Masahiro Kakuda, The Univ. of Tokyo (Japan)
Katsuyuki Watanabe, The Univ. of Tokyo (Japan)
Sei Inoue, NEC Corp. (Japan)
Kenji Nanba, NEC Corp. (Japan)
Yuichi Igarashi, NEC Corp. (Japan)
The Univ. of Tokyo (Japan)
Masahiro Tanomura, NEC Corp. (Japan)
The Univ. of Tokyo (Japan)
Tsuyoshi Yamamoto, NEC Corp. (Japan)
The Univ. of Tokyo (Japan)
Akinobu Shibuya, NEC Corp. (Japan)
The Univ. of Tokyo (Japan)
Kentaro Nakahara, NEC Corp. (Japan)
Shin-ichi Yorozu, NEC Corp. (Japan)
The Univ. of Tokyo (Japan)
Yasuhiko Arakawa, The Univ. of Tokyo (Japan)

Published in SPIE Proceedings Vol. 10231:
Optical Sensors 2017
Francesco Baldini; Jiri Homola; Robert A. Lieberman, Editor(s)

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