Proceedings Paper
Determination of temperature changes of refractive index and thickness of material in one optical interference experiment| Format | Member Price | Non-Member Price |
|---|---|---|
| $17.00 | $21.00 |
Paper Abstract
An optical interference method for simultaneous determination of the temperature dependences of refractive index n(T) and thickness 1(T) of transparent parallel-plane samples has been worked out. The method has been applied to a glass plate sample, and it was shown that dn/dT and (d1/dT)/1) temperature derivatives satisfactorily correlate with corresponding reference data. The determined inaccuracies of temperature changes of (delta) n/n and (delta) 1/1 have not exceeded 10-4. Investigation of (NH4)2SbF5 crystal by the proposed optical-interference method has confirmed the occurrence of the second order phase transitions at 292 and 168 K.
Paper Details
Date Published: 3 November 1995
PDF: 6 pages
Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); doi: 10.1117/12.226175
Published in SPIE Proceedings Vol. 2648:
International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
Sergey V. Svechnikov; Mikhail Ya. Valakh, Editor(s)
PDF: 6 pages
Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); doi: 10.1117/12.226175
Show Author Affiliations
Bohdan V. Andriyevsky, Lviv State Univ. (Ukraine)
Mykola O. Romanyuk, Institute of Physical Optics (Ukraine)
Published in SPIE Proceedings Vol. 2648:
International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
Sergey V. Svechnikov; Mikhail Ya. Valakh, Editor(s)
© SPIE. Terms of Use
