
Proceedings Paper
Interpretation of polarization speckle parameters in optical diagnostics of scattering mediumFormat | Member Price | Non-Member Price |
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Paper Abstract
In this work we suggest procedure that permits us to define phenomenological relations of observable polarization characteristics and statistical parameters of scattered light for non- uniform spatially polarized speckle pattern. It is based on the multiparametric regression model, which is obtained by numerical simulation of light scattering. Regression models have been constructed and their parameters' identification has been done for two detector aperture configurations: circular and two-point. In the latter case the analytical expressions for polarization moments as the functions of initial characteristics of electromagnetic field have been received too. This enables us to receive the quantitative estimation of regression model validity and precision of computer simulation.
Paper Details
Date Published: 3 November 1995
PDF: 7 pages
Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); doi: 10.1117/12.226136
Published in SPIE Proceedings Vol. 2648:
International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
Sergey V. Svechnikov; Mikhail Ya. Valakh, Editor(s)
PDF: 7 pages
Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); doi: 10.1117/12.226136
Show Author Affiliations
Oksana I. Barchuk, Kiev Univ. (Ukraine)
Tetiana V. Molebna, Kiev Univ. (Ukraine)
Alexandr G. Chumakov, Kiev Univ. (Ukraine)
Tetiana V. Molebna, Kiev Univ. (Ukraine)
Alexandr G. Chumakov, Kiev Univ. (Ukraine)
Vitalij N. Kurashov, Kiev Univ. (Ukraine)
Valeryj V. Marjenko, Kiev Univ. (Ukraine)
Valeryj V. Marjenko, Kiev Univ. (Ukraine)
Published in SPIE Proceedings Vol. 2648:
International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
Sergey V. Svechnikov; Mikhail Ya. Valakh, Editor(s)
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