Proceedings Paper
Measurement of reflection factor of recording coating of optical information carrier on cylindrical substrate| Format | Member Price | Non-Member Price |
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Paper Abstract
For measurements of reflection factor of recording cover, deposited on internal surface of glass cylindrical tube, we designed and manufactured a stand. It permits us to conduct the measurement of reflection factor of recording cover of optical information carrier within a time of not more than 25 s. The measurement of reflection factor is conducted on an 0.83 mkm wavelength of semi-conductor infrared laser. We admit the measurement of reflection factor for samples on flat substrates.
Paper Details
Date Published: 3 November 1995
PDF: 4 pages
Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); doi: 10.1117/12.226128
Published in SPIE Proceedings Vol. 2648:
International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
Sergey V. Svechnikov; Mikhail Ya. Valakh, Editor(s)
PDF: 4 pages
Proc. SPIE 2648, International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (3 November 1995); doi: 10.1117/12.226128
Show Author Affiliations
A. D. Leonetz, Institute for Information Recording Problems (Ukraine)
V. G. Kravetz, Institute for Information Recording Problems (Ukraine)
V. G. Kravetz, Institute for Information Recording Problems (Ukraine)
Andrey A. Kryuchin, Institute for Information Recording Problems (Ukraine)
Published in SPIE Proceedings Vol. 2648:
International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
Sergey V. Svechnikov; Mikhail Ya. Valakh, Editor(s)
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