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Proceedings Paper

Ambient pressure offgassing apparatus for screening materials utilized in environments supporting optical spaceborne systems
Author(s): Randall Heu; Joyce M. Steakley; Edward J. Petrosky
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Paper Abstract

The method and setup developed to test optical support materials for the HST are presented in terms of general applications to the ambient offgassing of contamination-sensitive instruments. An ex situ vacuum UV spectrophotometer is employed to analyze optical witness samples for optical degradation related to offgassing contaminants that are condensed onto the samples. A table of the ambient offgassing-test results lists the weight loss, wavelengths, and presence of visible films on 15 materials. The offgassing initial requirement of less than 12 ppm and/or the requirement after testing of less than 0.1 ppm are not fulfilled in the cases of seven materials. The testing procedure is found to be an efficient method for screening nonmetallic materials that support spaceborne optical systems. The offgassing data can support standard outgassing data to screen candidate materials effectively.

Paper Details

Date Published: 1 November 1990
PDF: 6 pages
Proc. SPIE 1329, Optical System Contamination: Effects, Measurement, Control II, (1 November 1990); doi: 10.1117/12.22611
Show Author Affiliations
Randall Heu, Lockheed Missiles & Space Co., Inc. (United States)
Joyce M. Steakley, Lockheed Missiles & Space Co., Inc. (United States)
Edward J. Petrosky, Lockheed Missiles & Space Co., Inc. (United States)

Published in SPIE Proceedings Vol. 1329:
Optical System Contamination: Effects, Measurement, Control II
A. Peter M. Glassford, Editor(s)

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