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Proceedings Paper

Metamaterial piezoelectric beam with synthetic impedance shunts
Author(s): Christopher Sugino; Stephen Leadenham; Massimo Ruzzene; Alper Erturk
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Paper Abstract

We present a metamaterial beam based on a piezoelectric bimorph with segmented electrodes. Previously, we found the theoretical response of the beam using the assumed-modes method, and derived the effect of the shunt circuit impedance applied to each pair of electrodes. The structural response is governed by a frequency- dependent stiffness term, which depends on a material/geometry-based electromechanical coupling parameter and the impedance of the shunt circuits. A simple way to interpret the response of the system with frequency- dependent stiffness is the root locus method, which immediately yields the poles of each mode of the system using simple geometric rules. Case studies are shown for creating locally resonant bandgap with or without negative capacitance. To justify the use of these admittances that often require power input to the system, the concept of synthetic impedance is extended to symmetric voltages, as are encountered in series-connected piezoelectric bimorphs. Synthetic impedance or admittance is a method for obtaining an arbitrary impedance across a load by measuring the voltage and applying the corresponding current using digital signal processing and an analog circuit. Time domain simulations using these synthetic impedance circuits are compared to the ideal frequency domain results with good agreement. Surprisingly, the necessary digital sampling rate for stability is significantly higher than the Nyquist frequency.

Paper Details

Date Published: 11 April 2017
PDF: 13 pages
Proc. SPIE 10164, Active and Passive Smart Structures and Integrated Systems 2017, 1016410 (11 April 2017); doi: 10.1117/12.2260320
Show Author Affiliations
Christopher Sugino, Georgia Institute of Technology (United States)
Stephen Leadenham, Georgia Institute of Technology (United States)
Massimo Ruzzene, Georgia Institute of Technology (United States)
Alper Erturk, Georgia Institute of Technology (United States)

Published in SPIE Proceedings Vol. 10164:
Active and Passive Smart Structures and Integrated Systems 2017
Gyuhae Park, Editor(s)

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