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Proceedings Paper

Development of nanoparticle embedded sizing for enhanced structural health monitoring of carbon fiber composites
Author(s): Christopher C. Bowland; Yangyang Wang; Amit K. Naskar
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Paper Abstract

Carbon fiber composites experience sudden, catastrophic failure when exposed to sufficient stress levels and provide no obvious visual indication of damage before they fail. With the commercial adoption of these high-performance composites in structural applications, a need for in-situ monitoring of their structural integrity is paramount. Therefore, ways in which to monitor these systems has gathered research interest. A common method for accomplishing this is measuring through-thickness resistance changes of the composite due to the fact that carbon fiber composites are electrically conductive. This provides information on whole-body stress levels imparted on the composite and can help identify the presence of damage. However, this technique relies on the carbon fiber and polymer matrix to reveal a resistance change. Here, an approach is developed that increases damage detection sensitivity. This is achieved by developing a facile synthesis method of integrating semiconducting nanomaterials, such as silicon carbide, into carbon fiber sizing. The piezoresistive effect exhibited by these nanomaterials provides more pronounced resistance changes in response to mechanical stress as compared to carbon fiber alone. This is investigated through fabricating a unidirectional composite and subsequently monitoring the electrical resistance during mechanical testing. By establishing this route for integrating nanomaterials into carbon fiber composites, various nanomaterials can see future composite integration to realize novel properties.

Paper Details

Date Published: 19 April 2017
PDF: 7 pages
Proc. SPIE 10169, Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, and Civil Infrastructure 2017, 101690L (19 April 2017); doi: 10.1117/12.2260032
Show Author Affiliations
Christopher C. Bowland, Oak Ridge National Lab. (United States)
Yangyang Wang, Oak Ridge National Lab. (United States)
Amit K. Naskar, Oak Ridge National Lab. (United States)

Published in SPIE Proceedings Vol. 10169:
Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, and Civil Infrastructure 2017
H. Felix Wu; Andrew L. Gyekenyesi; Peter J. Shull; Tzu-Yang Yu, Editor(s)

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