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Proceedings Paper

Nonoptical real-time particle fallout monitor
Author(s): Raymond L. Chuan; William D. Bowers
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Paper Abstract

The paper describes a size-selective fallout monitor that can be employed to assess the degradation of sensitive optical surfaces as well as facilitate the analysis of particle types. The device combines a vertical elutriator and a quartz crystal microbalance, and only particles greater than a specific size can pass through an upward laminar flow generated in the device. The larger particles cause a frequency shift in the crystal oscillator, thereby permitting the measurement of the fallout associated with the contamination of optical instruments.

Paper Details

Date Published: 1 November 1990
PDF: 11 pages
Proc. SPIE 1329, Optical System Contamination: Effects, Measurement, Control II, (1 November 1990); doi: 10.1117/12.22600
Show Author Affiliations
Raymond L. Chuan, Femtometrics (United States)
William D. Bowers, Femtometrics (United States)


Published in SPIE Proceedings Vol. 1329:
Optical System Contamination: Effects, Measurement, Control II
A. Peter M. Glassford, Editor(s)

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