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Proceedings Paper

Contamination control program results from three years of ground operations on the Extreme Ultraviolet Explorer instruments
Author(s): David C. Ray; Sharon R. Jelinsky; Barry Y. Welsh; Roger F. Malina
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Paper Abstract

A stringent contamination control plan has been developed for the optical components of the Extreme Ultraviolet Explorer instruments whose performance in the 80900 A wavelength range is highly sensitive to particulate and molecular contamination. The contamination control program has been implemented over the last three years during assembly test and calibration phases of the instrument. These phases have now been completed and the optics cavities of the instruments have been sealed until deployment in space. We discuss various approaches used during ground operations to meet optics'' contamination goals within the project schedule and budget. We also present the measured optical properties of EUV witness mirrors which remained with the flight mirrors during ground operations. These were used to track optical degradation due to contamination from the cleanroom and high vacuum test chamber environments. 1.

Paper Details

Date Published: 1 November 1990
PDF: 7 pages
Proc. SPIE 1329, Optical System Contamination: Effects, Measurement, Control II, (1 November 1990); doi: 10.1117/12.22589
Show Author Affiliations
David C. Ray, Univ. of California/Berkeley (United States)
Sharon R. Jelinsky, Univ. of California/Berkeley (United States)
Barry Y. Welsh, Univ. of California/Berkeley (United States)
Roger F. Malina, Univ. of California/Berkeley (United States)

Published in SPIE Proceedings Vol. 1329:
Optical System Contamination: Effects, Measurement, Control II
A. Peter M. Glassford, Editor(s)

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