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Proceedings Paper

Camouflage target detection via hyperspectral imaging plus information divergence measurement
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Paper Abstract

Target detection is one of most important applications in remote sensing. Nowadays accurate camouflage target distinction is often resorted to spectral imaging technique due to its high-resolution spectral/spatial information acquisition ability as well as plenty of data processing methods. In this paper, hyper-spectral imaging technique together with spectral information divergence measure method is used to solve camouflage target detection problem. A self-developed visual-band hyper-spectral imaging device is adopted to collect data cubes of certain experimental scene before spectral information divergences are worked out so as to discriminate target camouflage and anomaly. Full-band information divergences are measured to evaluate target detection effect visually and quantitatively. Information divergence measurement is proved to be a low-cost and effective tool for target detection task and can be further developed to other target detection applications beyond spectral imaging technique.

Paper Details

Date Published: 5 January 2017
PDF: 5 pages
Proc. SPIE 10244, International Conference on Optoelectronics and Microelectronics Technology and Application, 102440F (5 January 2017); doi: 10.1117/12.2257938
Show Author Affiliations
Yuheng Chen, Soochow Univ. (China)
Key Lab. of Advanced Optical Manufacturing Technologies (China)
Key Lab. of Modern Optical Technologies (China)
Xinhua Chen, Soochow Univ. (China)
Key Lab. of Advanced Optical Manufacturing Technologies (China)
Key Lab. of Modern Optical Technologies (China)
Jiankang Zhou, Soochow Univ. (China)
Key Lab. of Advanced Optical Manufacturing Technologies (China)
Key Lab. of Modern Optical Technologies (China)
Yiqun Ji, Soochow Univ. (China)
Key Lab. of Advanced Optical Manufacturing Technologies (China)
Key Lab. of Modern Optical Technologies (China)
Weimin Shen, Soochow Univ. (China)
Key Lab. of Advanced Optical Manufacturing Technologies (China)
Key Lab. of Modern Optical Technologies (China)


Published in SPIE Proceedings Vol. 10244:
International Conference on Optoelectronics and Microelectronics Technology and Application
Shaohua Yu; Jose Capmany; Yi Luo; Yikai Su; Songlin Zhuang; Yue Hao; Akihiko Yoshikawa; Chongjin Xie; Yoshiaki Nakano, Editor(s)

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