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Proceedings Paper

Selected electrical properties of high ohmic thick-film resistors
Author(s): Arkadiusz Dąbrowski; Adam Tatar; Andrzej Dziedzic
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Paper Abstract

Results of fabrication as well as electrical and stability characterization of thick-film high ohmic resistors are described in this paper. Five commercially available resistive compositions with sheet resistance of 1, 10, and 100 MΩ/sq were applied. The best properties were obtained for the lowest sheet resistance pastes, for which voltage coefficient of resistance (VCR) was lower than 3 ppm/V and hot temperature coefficient of resistance (HTCR) below 50 ppm/°C. Effect of resistor length on sheet resistance and impact of termination material were analyzed. High voltage pulse stress at 2 kV had negligible influence on resistors’ properties.

Paper Details

Date Published: 22 December 2016
PDF: 8 pages
Proc. SPIE 10175, Electron Technology Conference 2016, 1017514 (22 December 2016); doi: 10.1117/12.2255914
Show Author Affiliations
Arkadiusz Dąbrowski, Wroclaw Univ. of Science and Technology (Poland)
Adam Tatar, Wroclaw Univ. of Science and Technology (Poland)
Andrzej Dziedzic, Wroclaw Univ. of Science and Technology (Poland)

Published in SPIE Proceedings Vol. 10175:
Electron Technology Conference 2016
Barbara Swatowska; Wojciech Maziarz; Tadeusz Pisarkiewicz; Wojciech Kucewicz, Editor(s)

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