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Proceedings Paper

Thermal conductivity investigation of adhesive-free bond laser components
Author(s): Da Li; Pengda Hong; MahaLakshmi Vedula; Helmuth E. Meissner
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Paper Abstract

An interferometric method has been developed and employed at Onyx Optics, Inc. to accurately measure the thermal conductivity of laser-active crystals as function of dopant concentration or inactive materials such as single crystals, optical ceramics and glasses relative to a standard of assumed to be known thermal conductivity [1]. This technique can also provide information on heat transfer resistance at the interface between two materials in close thermal contact.

While the technique appears generally applicable to composites between optically homogeneous materials, we report on thermal conductivities and heat transfer coefficients of selected adhesive-free bond (AFB®) laser composites. Single crystal bars and AFB bonded crystal doublets with the combinations of various rare-earth (Nd3+, Yb3+, Er3+, and Tm3+ trivalent ion doped YAG, and un-doped YAG have been fabricated with the AFB technique. By loading the test sample in a vacuum cryostat, with a precisely controlled heat load at one end of the doublets, the temperature distribution inside the single crystal or the composite samples can been precisely mapped by measuring the optical path difference interferometrically, given the material’s thermal-optical properties. No measurable heat transfer resistance can be identified for the AFB interfaces between low-concentration doped YAG and un-doped YAG. For the heavily doped RE3+:YAG, for example, 10% Yb:YAG, the thermal conductivity measured in our experiment is 8.3 W/m•K, using the thermal conductivity of undoped YAG reported in [1] as basis. The thermal transfer resistance of the AFB interface with un-doped YAG, if there is any at the AFB interface, could be less than 1.29×10-6 m2•K/W.

Paper Details

Date Published: 16 February 2017
PDF: 7 pages
Proc. SPIE 10100, Optical Components and Materials XIV, 1010011 (16 February 2017); doi: 10.1117/12.2255577
Show Author Affiliations
Da Li, Onyx Optics Inc. (United States)
Pengda Hong, Onyx Optics Inc. (United States)
MahaLakshmi Vedula, Onyx Optics Inc. (United States)
Helmuth E. Meissner, Onyx Optics Inc. (United States)

Published in SPIE Proceedings Vol. 10100:
Optical Components and Materials XIV
Shibin Jiang; Michel J. F. Digonnet, Editor(s)

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