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Proceedings Paper

The quality study of recycled glass phosphor waste for LED
Author(s): Chun-Chin Tsai; Guan-Hao Chen; Cheng-Feng Yue; Cin-Fu Chen; Wood-Hi Cheng
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Paper Abstract

To study the feasibility and quality of recycled glass phosphor waste for LED packaging, the experiments were conducted to compare optical characteristics between fresh color conversion layer and that made of recycled waste. The fresh color conversion layer was fabricated through sintering pristine mixture of Y.A.G. powder [yellow phosphor (Y3AlO12 : Ce3+). Those recycled waste glass phosphor re-melted to form Secondary Molten Glass Phosphor (S.M.G.P.). The experiments on such low melting temperature glass results showed that transmission rates of S.M.G.P. are 9% higher than those of first-sintered glass phosphor, corresponding to 1.25% greater average bubble size and 36% more bubble coverage area in S.M.G.P. In the recent years, high power LED modules and laser projectors have been requiring higher thermal stability by using glass phosphor materials for light mixing. Nevertheless, phosphor and related materials are too expensive to expand their markets. It seems a right trend and research goal that recycling such waste of high thermal stability and quality materials could be preferably one of feasible cost-down solutions. This technical approach could bring out brighter future for solid lighting and light source module industries.

Paper Details

Date Published: 16 February 2017
PDF: 6 pages
Proc. SPIE 10124, Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XXI, 101241K (16 February 2017); doi: 10.1117/12.2254981
Show Author Affiliations
Chun-Chin Tsai, Far East Univ. (Taiwan)
Guan-Hao Chen, National Univ. of Kaohsiung (Taiwan)
Cheng-Feng Yue, Far East Univ. (Taiwan)
Cin-Fu Chen, Far East Univ. (Taiwan)
Wood-Hi Cheng, National Chung Hsing Univ. (Taiwan)

Published in SPIE Proceedings Vol. 10124:
Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XXI
Jong Kyu Kim; Michael R. Krames; Li-Wei Tu; Martin Strassburg, Editor(s)

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