
Proceedings Paper
Cryogenic optical performance of a lightweighted 20-inch SiC mirror and indications for thermal strain homogeneity and hysterisisFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
The properties of silicon carbide (low CTE, high modulus, high conductivity, low density) are ideal for mirrors performing at cryogenic temperatures. Test data at cryogenic temperatures indicate high thermal strain homogeneity as well as low hysteresis (critical properties for high quality optical performance). Until recently, the largest SiC mirrors tested at liquid helium temperatures have been only a few centimeters in diameter. Recently a lightweighted (6 kg) 20-inch-diameter SiC mirror manufactured by United Technologies Optical Systems was tested for figure change at 10 K. Hysteresis was quantified upon return to room temperature. The results indicate high thermal strain homogeneity and low hysteresis. These optical results are applied to a parametric model developed from numerous previous cryogenic tests to estimate the thermal strain variability. Quantitative comparisons to other cryogenic materials are made based on reported test data.
Paper Details
Date Published: 23 October 1995
PDF: 6 pages
Proc. SPIE 2543, Silicon Carbide Materials for Optics and Precision Structures, (23 October 1995); doi: 10.1117/12.225292
Published in SPIE Proceedings Vol. 2543:
Silicon Carbide Materials for Optics and Precision Structures
Mark A. Ealey, Editor(s)
PDF: 6 pages
Proc. SPIE 2543, Silicon Carbide Materials for Optics and Precision Structures, (23 October 1995); doi: 10.1117/12.225292
Show Author Affiliations
Kenneth J. Triebes, Lockheed Martin Palo Alto Research Labs. (United States)
Lynn W. Huff, Lockheed Martin Palo Alto Research Labs. (United States)
Lynn W. Huff, Lockheed Martin Palo Alto Research Labs. (United States)
Charles D. Cox, Litton Itek Optical Systems (United States)
John W. Pepi, Litton Itek Optical Systems (United States)
John W. Pepi, Litton Itek Optical Systems (United States)
Published in SPIE Proceedings Vol. 2543:
Silicon Carbide Materials for Optics and Precision Structures
Mark A. Ealey, Editor(s)
© SPIE. Terms of Use
