Share Email Print

Proceedings Paper

Reliability evaluation of a MEMS scanner
Author(s): S. Lani; Y. Marozau; M. Dadras
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Previously, the realization and closed loop control of a MEMS scanner integrating position sensors made with piezoresistive sensors was presented. It consisted of a silicon compliant membrane with integrated position sensors, on which a mirror and a magnet were assembled. This device was mounted on a PCB containing coils for electromagnetic actuation. In this work, the reliability of such system was evaluated through thermal and mechanical analysis. The objective of thermal analysis was to evaluate the lifetime of the MEMS scanner and is consisting of temperature cycling (-40°C to 100°C) and accelerated electrical endurance (100°C with power supplied to all electrical components). The objective of mechanical analysis was to assess the resistance of the system to mechanical stress and is consisting of mechanical shock and vibration. A high speed camera has been used to observe the behavior of the MEMS scanner. The use of shock stopper to improve the mechanical resistance has been evaluated and had demonstrated a resistance increase from 250g to 900g. The minimum shock resistance required for the system is 500g for transportation and 1000g for portative devices.

Paper Details

Date Published: 20 February 2017
PDF: 11 pages
Proc. SPIE 10116, MOEMS and Miniaturized Systems XVI, 1011606 (20 February 2017); doi: 10.1117/12.2252191
Show Author Affiliations
S. Lani, CSEM (Switzerland)
Y. Marozau, CSEM (Switzerland)
M. Dadras, CSEM (Switzerland)

Published in SPIE Proceedings Vol. 10116:
MOEMS and Miniaturized Systems XVI
Wibool Piyawattanametha; Yong-Hwa Park, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?