
Proceedings Paper
Understanding the source of dielectric loss in Titania/polypropylene nanocomposites up to 220 GHzFormat | Member Price | Non-Member Price |
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Paper Abstract
Nanocomposites are a promising new dielectric material for on-chip and chip-to-chip waveguides that operate at millimeter (mm)-wave frequencies because of their higher relative permittivity compared to neat polymers and their compatibility with printed circuit board processing. For dielectric waveguides, extremely low loss is critical; thus, understanding the origins of loss is an important step for these applications. In this paper, we investigate the sources of loss in TiO2/polypropylene (PP) nanocomposites, in which polypropylene-graft-maleic anhydride (PP-g-MA) is added as a compatibilizer. Compared to nanocomposites made without PP-g-MA, we find that PP-g-MA improves the distribution of nanoparticles in the PP matrix and significantly lowers loss. We also examine the contribution to dielectric loss from PP-g-MA by measuring samples that contain no TiO2 nanoparticles, and find that while increasing the amount of PP-g- MA in PP results in a higher loss, it is small compared to the loss that comes from the addition of TiO2 nanoparticles.
Paper Details
Date Published: 20 February 2017
PDF: 7 pages
Proc. SPIE 10109, Optical Interconnects XVII, 1010908 (20 February 2017); doi: 10.1117/12.2250346
Published in SPIE Proceedings Vol. 10109:
Optical Interconnects XVII
Henning Schröder; Ray T. Chen, Editor(s)
PDF: 7 pages
Proc. SPIE 10109, Optical Interconnects XVII, 1010908 (20 February 2017); doi: 10.1117/12.2250346
Show Author Affiliations
Michael D. Womble, The Univ. of Texas at Dallas (United States)
Juan Herbsommer, Texas Instruments (United States)
Juan Herbsommer, Texas Instruments (United States)
Yun-Ju Lee, The Univ. of Texas at Dallas (United States)
Julia Hsu, The Univ. of Texas at Dallas (United States)
Julia Hsu, The Univ. of Texas at Dallas (United States)
Published in SPIE Proceedings Vol. 10109:
Optical Interconnects XVII
Henning Schröder; Ray T. Chen, Editor(s)
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