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Proceedings Paper

Multi-wavelength mid-IR light source for gas sensing
Author(s): Pentti Karioja; Teemu Alajoki; Matteo Cherchi; Jyrki Ollila; Mikko Harjanne; Noora Heinilehto; Soile Suomalainen; Jukka Viheriälä; Nouman Zia; Mircea Guina; Ryszard Buczyński; Rafał Kasztelanic; Ireneusz Kujawa; Tomi Salo; Sami Virtanen; Paweł Kluczyński; Håkon Sagberg; Marcin Ratajczyk; Przemyslaw Kalinowski
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Paper Abstract

Cost effective multi-wavelength light sources are key enablers for wide-scale penetration of gas sensors at Mid-IR wavelength range. Utilizing novel Mid-IR Si-based photonic integrated circuits (PICs) filter and wide-band Mid-IR Super Luminescent Light Emitting Diodes (SLEDs), we show the concept of a light source that covers 2.5…3.5 μm wavelength range with a resolution of <1nm. The spectral bands are switchable and tunable and they can be modulated. The source allows for the fabrication of an affordable multi-band gas sensor with good selectivity and sensitivity. The unit price can be lowered in high volumes by utilizing tailored molded IR lens technology and automated packaging and assembling technologies. The status of the development of the key components of the light source are reported. The PIC is based on the use of micron-scale SOI technology, SLED is based on AlGaInAsSb materials and the lenses are tailored heavy metal oxide glasses fabricated by the use of hot-embossing. The packaging concept utilizing automated assembly tools is depicted. In safety and security applications, the Mid-IR wavelength range covered by the novel light source allows for detecting several harmful gas components with a single sensor. At the moment, affordable sources are not available. The market impact is expected to be disruptive, since the devices currently in the market are either complicated, expensive and heavy instruments, or the applied measurement principles are inadequate in terms of stability and selectivity.

Paper Details

Date Published: 20 February 2017
PDF: 9 pages
Proc. SPIE 10110, Photonic Instrumentation Engineering IV, 101100P (20 February 2017); doi: 10.1117/12.2249126
Show Author Affiliations
Pentti Karioja, VTT Technical Research Ctr. of Finland Ltd. (Finland)
Teemu Alajoki, VTT Technical Research Ctr. of Finland Ltd. (Finland)
Matteo Cherchi, VTT Technical Research Ctr. of Finland Ltd. (Finland)
Jyrki Ollila, VTT Technical Research Ctr. of Finland Ltd. (Finland)
Mikko Harjanne, VTT Technical Research Ctr. of Finland Ltd. (Finland)
Noora Heinilehto, VTT Technical Research Ctr. of Finland Ltd. (Finland)
Soile Suomalainen, Tampere Univ. of Technology (Finland)
Jukka Viheriälä, Tampere Univ. of Technology (Finland)
Nouman Zia, Tampere Univ. of Technology (Finland)
Mircea Guina, Tampere Univ. of Technology (Finland)
Ryszard Buczyński, Institute of Electronic Materials Technology (Poland)
Rafał Kasztelanic, Institute of Electronic Materials Technology (Poland)
Ireneusz Kujawa, Institute of Electronic Materials Technology (Poland)
Tomi Salo, Vaisala Oyj (Finland)
Sami Virtanen, Vaisala Oyj (Finland)
Paweł Kluczyński, Airoptic Sp z.o.o. (Poland)
Håkon Sagberg, GasSecure AS (Norway)
Marcin Ratajczyk, VIGO System S.A. (Poland)
Przemyslaw Kalinowski, VIGO System S.A. (Poland)

Published in SPIE Proceedings Vol. 10110:
Photonic Instrumentation Engineering IV
Yakov G. Soskind; Craig Olson, Editor(s)

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