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Proceedings Paper

Infrared transparent conductive diffused layers in germanium windows
Author(s): Michael R. Borden
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Paper Abstract

Infrared transparent conductive diffused layers have been integrated into germanium windows using an ion- implantation/diffusion technique. These layers are nominally 25 microns thick with sheet resistivities of 5-10 ohms/square. The excellent transmission characteristics of the germanium windows are maintained, with maximum transmission degradation of only 3 and 5% in the 3-5 and 8-12 micron bandpasses, respectively.

Paper Details

Date Published: 1 October 1990
PDF: 7 pages
Proc. SPIE 1326, Window and Dome Technologies and Materials II, (1 October 1990);
Show Author Affiliations
Michael R. Borden, Hughes Danbury Optical Systems (United States)


Published in SPIE Proceedings Vol. 1326:
Window and Dome Technologies and Materials II
Paul Klocek, Editor(s)

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