
Proceedings Paper
High-accurate optical vector analysis based on optical single-sideband modulationFormat | Member Price | Non-Member Price |
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Paper Abstract
Most of the efforts devoted to the area of optical communications were on the improvement of the optical spectral
efficiency. Varies innovative optical devices are thus developed to finely manipulate the optical spectrum. Knowing the
spectral responses of these devices, including the magnitude, phase and polarization responses, is of great importance for
their fabrication and application. To achieve high-resolution characterization, optical vector analyzers (OVAs) based on
optical single-sideband (OSSB) modulation have been proposed and developed. Benefiting from the mature and highresolution
microwave technologies, the OSSB-based OVA can potentially achieve a resolution of sub-Hz. However, the
accuracy is restricted by the measurement errors induced by the unwanted first-order sideband and the high-order
sidebands in the OSSB signal, since electrical-to-optical conversion and optical-to-electrical conversion are essentially
required to achieve high-resolution frequency sweeping and extract the magnitude and phase information in the electrical
domain. Recently, great efforts have been devoted to improve the accuracy of the OSSB-based OVA. In this paper, the
influence of the unwanted-sideband induced measurement errors and techniques for implementing high-accurate OSSB-based
OVAs are discussed.
Paper Details
Date Published: 4 November 2016
PDF: 6 pages
Proc. SPIE 10026, Real-time Photonic Measurements, Data Management, and Processing II, 1002608 (4 November 2016); doi: 10.1117/12.2248509
Published in SPIE Proceedings Vol. 10026:
Real-time Photonic Measurements, Data Management, and Processing II
Ming Li; Bahram Jalali; Keisuke Goda; Kevin K. Tsia, Editor(s)
PDF: 6 pages
Proc. SPIE 10026, Real-time Photonic Measurements, Data Management, and Processing II, 1002608 (4 November 2016); doi: 10.1117/12.2248509
Show Author Affiliations
Min Xue, Nanjing Univ. of Aeronautics and Astronautics (China)
Shilong Pan, Nanjing Univ. of Aeronautics and Astronautics (China)
Published in SPIE Proceedings Vol. 10026:
Real-time Photonic Measurements, Data Management, and Processing II
Ming Li; Bahram Jalali; Keisuke Goda; Kevin K. Tsia, Editor(s)
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