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Proceedings Paper

Imaging performance of crystalline and polycrystalline oxides
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Paper Abstract

Knowledge of the scatter characteristics of candidate infrared sensor dome materials is necessary for the evaluation of image quality and susceptibility to bright off-axis sources. For polycrystalline materials in particular, the scattering levels are high enough to warrant concern. To evaluate the effects of scatter on image quality, estimates of the window Point Spread Function (PSF), or its transform, the Optical Transfer Function (OTF) are required. Additionally, estimates of the material scatter cross-section per unit volume are essential for determining flare susceptibility. Experimental procedures and models in use at JHU/APL allow the determination of each. Measurement results are provided for samples of A1203 (ordinary ray), Y203, LaO3-doped Y203, MgAL2O4, and ALON. Applications of these results are illustrated for planar windows having arbitrary orientations with respect to the optical axis.

Paper Details

Date Published: 1 October 1990
PDF: 12 pages
Proc. SPIE 1326, Window and Dome Technologies and Materials II, (1 October 1990); doi: 10.1117/12.22482
Show Author Affiliations
Donald Dean Duncan, Johns Hopkins Univ. (United States)
Charles H. Lange, Johns Hopkins Univ. (United States)
David J. Fischer, Univ. of Rochester (United States)

Published in SPIE Proceedings Vol. 1326:
Window and Dome Technologies and Materials II
Paul Klocek, Editor(s)

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