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Proceedings Paper

Experiments and error analysis of laser ranging based on frequency-sweep polarization modulation
Author(s): Shuyuan Gao; Rongyi Ji; Yao Li; Zhi Cheng; Weihu Zhou
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Paper Abstract

Frequency-sweep polarization modulation ranging uses a polarization-modulated laser beam to determine the distance to the target, the modulation frequency is swept and frequency values are measured when transmitted and received signals are in phase, thus the distance can be calculated through these values. This method gets much higher theoretical measuring accuracy than phase difference method because of the prevention of phase measurement. However, actual accuracy of the system is limited since additional phase retardation occurs in the measuring optical path when optical elements are imperfectly processed and installed. In this paper, working principle of frequency sweep polarization modulation ranging method is analyzed, transmission model of polarization state in light path is built based on the theory of Jones Matrix, additional phase retardation of λ/4 wave plate and PBS, their impact on measuring performance is analyzed. Theoretical results show that wave plate’s azimuth error dominates the limitation of ranging accuracy. According to the system design index, element tolerance and error correcting method of system is proposed, ranging system is built and ranging experiment is performed. Experiential results show that with proposed tolerance, the system can satisfy the accuracy requirement. The present work has a guide value for further research about system design and error distribution.

Paper Details

Date Published: 24 November 2016
PDF: 8 pages
Proc. SPIE 10023, Optical Metrology and Inspection for Industrial Applications IV, 1002322 (24 November 2016); doi: 10.1117/12.2247821
Show Author Affiliations
Shuyuan Gao, Hefei Univ. of Technology (China)
Academy of Opto-Electronics (China)
Rongyi Ji, Academy of Opto-Electronics (China)
Yao Li, Academy of Opto-Electronics (China)
Zhi Cheng, Academy of Opto-Electronics (China)
Weihu Zhou, Academy of Opto-Electronics (China)
Univ. of Chinese Academy of Sciences (China)

Published in SPIE Proceedings Vol. 10023:
Optical Metrology and Inspection for Industrial Applications IV
Sen Han; Toru Yoshizawa; Song Zhang, Editor(s)

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