
Proceedings Paper
Progress in upgrading a long trace profiler at NSRRCFormat | Member Price | Non-Member Price |
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$17.00 | $21.00 |
Paper Abstract
A long trace profiler in NSRRC is used to develop a bendable mirror, for the mirror-mounting mechanism and to inspect the mirrors of TPS beamlines. We upgraded the air bearing, the motor and gear, the penta-mirror, the CCD and the software. ELCOMATT 3000 is our calibration reference. To maintain constant the measurement of the optical path, we adopted a scheme for a moving optical head that decreases the various optical paths through a focusing lens to avoid lens homogeneity. The measurement environment (temperature, vibration, air turbulence) is effectively controlled. In measuring a curved mirror (radius 9.7 m), the repeatability is below 0.1 μrad. This paper describes the upgraded performance and engineering details.
Paper Details
Date Published: 25 October 2016
PDF: 7 pages
Proc. SPIE 9687, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics, 96870F (25 October 2016); doi: 10.1117/12.2247664
Published in SPIE Proceedings Vol. 9687:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics
Shinan Qian; Mourad Idir; Daniele Cocco; Tiqiao Xiao; Kazuto Yamauchi, Editor(s)
PDF: 7 pages
Proc. SPIE 9687, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics, 96870F (25 October 2016); doi: 10.1117/12.2247664
Show Author Affiliations
Shen-Yaw Perng, NSRRC (Taiwan)
Published in SPIE Proceedings Vol. 9687:
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics
Shinan Qian; Mourad Idir; Daniele Cocco; Tiqiao Xiao; Kazuto Yamauchi, Editor(s)
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