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Proceedings Paper

Simulation of laser bistatic two-dimensional scattering imaging about lambertian cylinders
Author(s): Yanjun Gong; Lang Li; Mingjun Wang; Lei Gong
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Paper Abstract

This paper deals with the simulation of laser bi-static scattering imaging about lambertian cylinders. Two-dimensional imaging of a target can reflect the shape of the target and material property on the surface of the target. Two-dimensional imaging has important significance for target recognition. Simulations results of laser bi-static two-dimensional scattering imaging of some cylinders are given. The laser bi-static scattering imaging of cylinder, whose surface material with diffuse lambertian reflectance, is given in this paper. The scattering direction of laser bi-static scattering imaging is arbitrary direction. The scattering direction of backward two-dimensional scattering imaging is at opposite direction of the incident direction of laser. The backward two-dimensional scattering imaging is special case of bi-static two dimensional scattering imaging. The scattering intensity of a micro-element on the target could be obtained based on the laser radar equation. The intensity is related to local angle of incidence, local angle of scattering and the infinitesimal area on the surface of cylinder. According to the incident direction of incident laser and normal of infinitesimal area, the local incidence angle can be calculated. According to the scattering direction and normal of infinitesimal area, the local angle of scattering can be calculated. Through surface integration and the introduction of the rectangular function, we can get the intensity of imaging unit on the imaging surface, and then get mathematical model of bi-static laser two dimensional scattering imaging about lambert cylinder. From the results given, one can see that the simulation results of laser bi-static scattering about lambert cylinder is correct.

Paper Details

Date Published: 19 October 2016
PDF: 6 pages
Proc. SPIE 10155, Optical Measurement Technology and Instrumentation, 101553E (19 October 2016); doi: 10.1117/12.2247374
Show Author Affiliations
Yanjun Gong, Hunan Univ. of Science and Engineering (China)
Lang Li, Hunan Univ. of Science and Engineering (China)
Mingjun Wang, Xian Yang Normal College (China)
Lei Gong, Xi’an Technological Univ. (China)

Published in SPIE Proceedings Vol. 10155:
Optical Measurement Technology and Instrumentation
Sen Han; JiuBin Tan, Editor(s)

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