Share Email Print

Proceedings Paper

Reflectivity and depth images based on time-correlated single photon counting technique
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

We presented three-dimensional image including reflectivity and depth image of a target with two traditional optical imaging systems based on time-correlated single photon counting technique (TCSPC), when it was illuminated by a MHz repetition rate pulsed laser source. The first one is bi-static system of which transmitted and received beams path are separated. Another one called mono-static system of which transmit and receive channels are coaxial, so it was also named by transceiver system. Experimental results produced by both systems showed that the mono-static system had more advantages of less noise from ambient light and no limitation about field area of view. While in practical applications, the target was far away leading to there were few photons return which was prejudicial to build 3D images with traditional imaging system. Thus an advanced one named first photon system was presented. This one was also a mono-static system on hardware system structure, but the control system structure was different with traditional transceiver system described in this paper. The difference was that the first return photon per pixel was recorded across system with first photon system, instead of overall return photons per pixel. That’s to say only one detected return photon is needed for per pixel of this system to rebuild 3D images of target with less energy and time.

Paper Details

Date Published: 19 October 2016
PDF: 9 pages
Proc. SPIE 10155, Optical Measurement Technology and Instrumentation, 101552X (19 October 2016); doi: 10.1117/12.2247242
Show Author Affiliations
Xuejie Duan, Xidian Univ. (China)
Lin Ma, Xidian Univ. (China)
Yan Kang, Xi‘an Institute of Optics and Precision Mechanics (China)
Tongyi Zhang, Xi‘an Institute of Optics and Precision Mechanics (China)

Published in SPIE Proceedings Vol. 10155:
Optical Measurement Technology and Instrumentation
Sen Han; JiuBin Tan, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?