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Proceedings Paper

A system for diagnosis of wheat leaf diseases based on Android smartphone
Author(s): Xinhua Xie; Xiangqian Zhang; Bing He; Dong Liang; Dongyang Zhang; Linsheng Huang
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Paper Abstract

Owing to the shortages of inconvenience, expensive and high professional requirements etc. for conventional recognition devices of wheat leaf diseases, it does not satisfy the requirements of uploading and releasing timely investigation data in the large-scale field, which may influence the effectiveness of prevention and control for wheat diseases. In this study, a fast, accurate, and robust diagnose system of wheat leaf diseases based on android smartphone was developed, which comprises of two parts—the client and the server. The functions of the client include image acquisition, GPS positioning, corresponding, and knowledge base of disease prevention and control. The server includes image processing, feature extraction, and selection, and classifier establishing. The recognition process of the system goes as follow: when disease images were collected in fields and sent to the server by android smartphone, and then image processing of disease spots was carried out by the server. Eighteen larger weight features were selected by algorithm relief-F and as the input of Relevance Vector Machine (RVM), and the automatic identification of wheat stripe rust and powdery mildew was realized. The experimental results showed that the average recognition rate and predicted speed of RVM model were 5.56% and 7.41 times higher than that of Support Vector Machine (SVM). And application discovered that it needs about 1 minute to get the identification result. Therefore, it can be concluded that the system could be used to recognize wheat diseases and real-time investigate in fields.

Paper Details

Date Published: 19 October 2016
PDF: 9 pages
Proc. SPIE 10155, Optical Measurement Technology and Instrumentation, 1015526 (19 October 2016); doi: 10.1117/12.2246919
Show Author Affiliations
Xinhua Xie, Anhui Univ. (China)
Xiangqian Zhang, Anhui Univ. (China)
Bing He, Anhui Univ. (China)
Dong Liang, Anhui Univ. (China)
Dongyang Zhang, Anhui Univ. (China)
Linsheng Huang, Anhui Univ. (China)

Published in SPIE Proceedings Vol. 10155:
Optical Measurement Technology and Instrumentation
Sen Han; JiuBin Tan, Editor(s)

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