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Proceedings Paper

Optical micro-scanning zero calibration for a thermal microscope imaging system
Author(s): Mei-Jing Gao; Xu Jie; Ai-Ling Tan; Wei-Long Wu
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Paper Abstract

To improve the spatial resolution of the thermal microscope imaging system, the micro-scanning zero point should be determined. Based on geometric principles, a new technique for zero calibration by using an image registration algorithm is presented. The aim of the technique is to obtain the size and direction of the zero calibration angles by estimating the displacement between two thermal microscope images. The simulations and experiments are conducted separately before and after the zero calibration is determined. Our main results show that the proposed technique can effectively improve the thermal microscope imaging quality. Furthermore this technique can also be applied to other electro-optical imaging systems and improve their resolutions.

Paper Details

Date Published: 1 November 2016
PDF: 7 pages
Proc. SPIE 10157, Infrared Technology and Applications, and Robot Sensing and Advanced Control, 101572F (1 November 2016); doi: 10.1117/12.2246840
Show Author Affiliations
Mei-Jing Gao, Yanshan Univ. (China)
Xu Jie, Yanshan Univ. (China)
Ai-Ling Tan, Yanshan Univ. (China)
Wei-Long Wu, Yanshan Univ. (China)

Published in SPIE Proceedings Vol. 10157:
Infrared Technology and Applications, and Robot Sensing and Advanced Control

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