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Proceedings Paper

Research of spectacle frame measurement system based on structured light method
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Paper Abstract

Automatic eyeglass lens edging system is now widely used to automatically cut and polish the uncut lens based on the spectacle frame shape data which is obtained from the spectacle frame measuring machine installed on the system. The conventional approach to acquire the frame shape data works in the contact scanning mode with a probe tracing around the groove contour of the spectacle frame which requires a sophisticated mechanical and numerical control system. In this paper, a novel non-contact optical measuring method based on structured light to measure the three dimensional (3D) data of the spectacle frame is proposed. First we focus on the processing approach solving the problem of deterioration of the structured light stripes caused by intense specular reflection on the frame surface. The techniques of bright-dark bi-level fringe projecting, multiple exposuring and high dynamic range imaging are introduced to obtain a high-quality image of structured light stripes. Then, the Gamma transform and median filtering are applied to enhance image contrast. In order to get rid of background noise from the image and extract the region of interest (ROI), an auxiliary lighting system of special design is utilized to help effectively distinguish between the object and the background. In addition, a morphological method with specific morphological structure-elements is adopted to remove noise between stripes and boundary of the spectacle frame. By further fringe center extraction and depth information acquisition through the method of look-up table, the 3D shape of the spectacle frame is recovered.

Paper Details

Date Published: 19 October 2016
PDF: 7 pages
Proc. SPIE 10155, Optical Measurement Technology and Instrumentation, 101551W (19 October 2016); doi: 10.1117/12.2246753
Show Author Affiliations
Dong Guan, Zhejiang Univ. (China)
Xiaodong Chen, Zhejiang Univ. (China)
Xiuda Zhang, Zhejiang Univ. (China)
Huimin Yan, Zhejiang Univ. (China)

Published in SPIE Proceedings Vol. 10155:
Optical Measurement Technology and Instrumentation
Sen Han; JiuBin Tan, Editor(s)

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