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Proceedings Paper

Failure analysis and preventive measures of light-emitting diode
Author(s): Zhong-Shu Yang
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Paper Abstract

In order to study the effect of light-emitting diode reliability made by electrical overstress, in this paper, the LF3R light-emitting diode is taken as an example, the basic failure model of diode is set up and the main factors affecting the performance and reliability of light-emitting diode are given, then the measures to prevent failures of light-emitting diode are given, which is of guide significance to the proper use of light-emitting diode. The test results show that the modeling of LF3R reflects its failure regularity and is applicable in practice.

Paper Details

Date Published: 19 October 2016
PDF: 6 pages
Proc. SPIE 10154, Advanced Optical Design and Manufacturing Technology and Astronomical Telescopes and Instrumentation, 101541A (19 October 2016); doi: 10.1117/12.2246747
Show Author Affiliations
Zhong-Shu Yang, Naval Institute of Aeronautic Engineering (China)


Published in SPIE Proceedings Vol. 10154:
Advanced Optical Design and Manufacturing Technology and Astronomical Telescopes and Instrumentation
Min Xu; Ji Yang, Editor(s)

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